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Filtering Study of Threading Dislocations in AlN Buffered MBE GaN/Sapphire Using Single and Multiple High Temperature AlN Intermediate Layers

✍ Scribed by Ponce, A. ;S�nchez, A.M. ;Molina, S.I. ;Fedler, F. ;Stemmer, J. ;Graul, J.


Publisher
John Wiley and Sons
Year
2002
Tongue
English
Weight
147 KB
Volume
192
Category
Article
ISSN
0031-8965

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