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Device assessment of the electrical activity of threading dislocations in strained Ge epitaxial layers

✍ Scribed by E. Simoen; G. Brouwers; G. Eneman; M. Bargallo Gonzalez; B. De Jaeger; J. Mitard; D.P. Brunco; L. Souriau; N. Cody; S. Thomas; M. Meuris


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
298 KB
Volume
11
Category
Article
ISSN
1369-8001

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