Growth and characterization of bilayer InAs/GaAs quantum dot structures
β Scribed by Liang, B. L. ;Wang, Zh. M. ;Mazur, Yu. I. ;Strelchuck, V. V. ;Salamo, G. J.
- Book ID
- 105363815
- Publisher
- John Wiley and Sons
- Year
- 2006
- Tongue
- English
- Weight
- 381 KB
- Volume
- 203
- Category
- Article
- ISSN
- 0031-8965
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β¦ Synopsis
Abstract
One of the difficulties in understanding energy transfer in bilayer quantum dot structures is the complex role of carrier tunneling. This limitation is due to the fact that, for most studies to date, QDs in each layer have only one confined energy level making it difficult to study resonant tunneling effects. In this work, we have investigated the low growthβrate technique to produce dislocationβfree very large QDs in the second layer that are characterized by several confined energy levels. The high quality surface morphology and optical behavior of these structures were demonstrated by AFM and PL measurements. (Β© 2006 WILEYβVCH Verlag GmbH & Co. KGaA, Weinheim)
π SIMILAR VOLUMES
In this work we present the results of an electrical and structural characterization of molecular beam epitaxy (MBE) grown InAs/In 0.15 Ga 0.85 As quantum dot (QD) structures having InAs coverages of 2.0 and 3.0 ML that are, respectively, below and above the expected critical value for QD ripening i
## Abstract We present the results of a comprehensive study carried out on morphological, structural and optical properties of InAs/GaAs quantum dot structures grown by Molecular Beam Epitaxy. InAs quantum dots were deposited at low growth rate and high growth temperature and were capped with InGaA