In this work we present the results of an electrical and structural characterization of molecular beam epitaxy (MBE) grown InAs/In 0.15 Ga 0.85 As quantum dot (QD) structures having InAs coverages of 2.0 and 3.0 ML that are, respectively, below and above the expected critical value for QD ripening i
β¦ LIBER β¦
Electrical characterization of InAs/GaAs quantum dot structures
β Scribed by E. Gombia; R. Mosca; S. Franchi; P. Frigeri; C. Ghezzi
- Book ID
- 108215965
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 168 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0928-4931
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