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Giant Pd Clusters Observed by High Resolution Electron Microscopy

✍ Scribed by Viacheslav V. Volkov; Gustaaf Van. Tendeloo; Michael N. Vargaftik; Igor P. Stolyarov; llya I. Moiseev


Book ID
111729515
Publisher
Royal Society of Chemistry
Year
1993
Tongue
English
Weight
450 KB
Volume
3
Category
Article
ISSN
0959-9436

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## Abstract Dislocations in deformed silicon crystals have been studied by high‐resolution electron microscopy with the axial illumination along the [110] direction using a 1 MV electron microscope. Extended 60 dislocations, Z‐shape faulted dipoles and stacking fault tetrahedra were observed in ato