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High-resolution electron microscopy observations of large Pd clusters

✍ Scribed by V.V. Volkov; G. Van Tendeloo; M.N. Vargaftik; I.I. Moiseev


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
787 KB
Volume
132
Category
Article
ISSN
0022-0248

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## Abstract Dislocations in deformed silicon crystals have been studied by high‐resolution electron microscopy with the axial illumination along the [110] direction using a 1 MV electron microscope. Extended 60 dislocations, Z‐shape faulted dipoles and stacking fault tetrahedra were observed in ato