𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Gray tin observed by high-resolution electron microscopy

✍ Scribed by K. Ojima; Y. Taneda


Publisher
Springer
Year
1991
Tongue
English
Weight
856 KB
Volume
10
Category
Article
ISSN
0261-8028

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Dislocations in silicon observed by high
✍ K. Hiraga; M. Hirabayashi; M. Sato; K. Sumino πŸ“‚ Article πŸ“… 1982 πŸ› John Wiley and Sons 🌐 English βš– 600 KB

## Abstract Dislocations in deformed silicon crystals have been studied by high‐resolution electron microscopy with the axial illumination along the [110] direction using a 1 MV electron microscope. Extended 60 dislocations, Z‐shape faulted dipoles and stacking fault tetrahedra were observed in ato

High resolution electron microscopy
✍ Hatsujiro Hashimoto πŸ“‚ Article πŸ“… 1983 πŸ› Elsevier Science 🌐 English βš– 81 KB