In this paper, we introduce the concept of detectable perturbations as a method to generate tests that cover any technology-specific faults such as multiple bridging, open and stuck-at faults. Rather than devising a customized test pattern generation system for each class of technology-specific faul
β¦ LIBER β¦
Generating minimal fault detecting test suites for general Boolean specifications
β Scribed by Angelo Gargantini; Gordon Fraser
- Book ID
- 113658965
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 469 KB
- Volume
- 53
- Category
- Article
- ISSN
- 0950-5849
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