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A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs

✍ Scribed by Harutyunyan, G.; Shoukourian, S.; Vardanian, V.; Zorian, Y.

Book ID
117908597
Publisher
IEEE
Year
2012
Tongue
English
Weight
327 KB
Volume
31
Category
Article
ISSN
0278-0070

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