Test generation for technology-specific
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Andrej Zemva; Baldomir Zajc
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Article
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2005
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Elsevier Science
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English
⚖ 397 KB
In this paper, we introduce the concept of detectable perturbations as a method to generate tests that cover any technology-specific faults such as multiple bridging, open and stuck-at faults. Rather than devising a customized test pattern generation system for each class of technology-specific faul