𝔖 Bobbio Scriptorium
✦   LIBER   ✦

FUNCTIONALITY FAULT MODEL: A BASIS FOR TECHNOLOGY-SPECIFIC TEST GENERATION

✍ Scribed by Andrej žemva; Baldomir Zajc


Book ID
108362255
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
267 KB
Volume
38
Category
Article
ISSN
0026-2714

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES


Test generation for technology-specific
✍ Andrej Zemva; Baldomir Zajc 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 397 KB

In this paper, we introduce the concept of detectable perturbations as a method to generate tests that cover any technology-specific faults such as multiple bridging, open and stuck-at faults. Rather than devising a customized test pattern generation system for each class of technology-specific faul