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General framework about defect creation at the SiâSiO[sub 2] interface

✍ Scribed by Guerin, C.; Huard, V.; Bravaix, A.

Book ID: 120989276
Publisher: American Institute of Physics
Year: 2009
Tongue: English
Weight: 789 KB
Volume: 105
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.3133096

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