✦ LIBER ✦

Characteristic electronic defects at the Si-SiO2 interface

✍ Scribed by Johnson, N. M.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Individual defects at the Si:SiO 2 inter

✍ Kirton, M J; Uren, M J; Collins, S; Schulz, M; Karmann, A; Scheffer, K 📂 Article 📅 1989 🏛 Institute of Physics 🌐 English ⚖ 966 KB

Characteristic defects generated at the

✍ A.S. Vengurlekar; V. Lakshmanna; K.V. Ramanathan 📂 Article 📅 1985 🏛 Elsevier Science ⚖ 343 KB

Generation of defects at Si-SiO2 interfa

✍ Takuo Sugano; Ching-Fa Yeh 📂 Article 📅 1981 🏛 John Wiley and Sons 🌐 English ⚖ 444 KB

Oxygen interaction with defects at the S

✍ J.H. Stathis; S. Rigo; I. Trimaille 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 194 KB

TP-A2 electronic properties of a charact

✍ Johnson, N.M.; Bartelink, D.J.; McVittie, J.P. 📂 Article 📅 1978 🏛 IEEE 🌐 English ⚖ 322 KB

Electron attenuation lengths at SiO2/Si

✍ J.A. Yarmoff; S.A. Joyce; E. Cartier; F.R. McFeely 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 428 KB