✦ LIBER ✦

Characteristic defects generated at the Si/SiO2 interface during avalanche injection of holes

✍ Scribed by A.S. Vengurlekar; V. Lakshmanna; K.V. Ramanathan

Publisher: Elsevier Science
Year: 1985
Weight: 343 KB
Volume: 22-23
Category: Article
ISSN: 0378-5963
DOI: 10.1016/0378-5963(85)90230-2

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Interface states generated by the inject

Interface states generated by the injection of electrons and holes into SiO2

✍ S.A. Lyon 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 547 KB

Oxide field dependence of SiSiO2 interf

Oxide field dependence of SiSiO2 interface state generation and charge trapping during electron injection

✍ M.M. Heyns; D. Krishna Rao; R.F. De Keersmaecker 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 492 KB

Low T characterization of the Pbo- defec

Low T characterization of the Pbo- defect spin relaxation at (111) Si/SiO2 interfaces

✍ J. Braet; A. Stesmans 📂 Article 📅 1984 🏛 Elsevier Science ⚖ 165 KB

On the segregation of Ca at SiO2/Si inte

On the segregation of Ca at SiO2/Si interface during oxygen ion bombardment

✍ Deenapanray, Prakash N. K.; Petravic, Mladen 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 128 KB

Segregation of Ca in Si has been studied using SIMS and RBS. Pronounced Ca profile broadening is observed during SIMS measurements with oxygen ions under bombardment conditions, yielding the formation of a stoichiometric oxide layer at the surface. Additional profiling through the SiO 2 /Si interfac

Hall effect measurements of hole mobilit

Hall effect measurements of hole mobility in an inversion layer at the SiSiO2 interface

✍ Toscano-Rico, A. ;Pfister, J. C. 📂 Article 📅 1971 🏛 John Wiley and Sons 🌐 English ⚖ 597 KB

Thermodynamic and kinetic stability with

Thermodynamic and kinetic stability with respect to hole trapping. of silanic bonds at the Si–SiO2interface

✍ G.F. Cerofolini 📂 Article 📅 2003 🏛 Springer 🌐 English ⚖ 81 KB