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Formation of extended mesodefects in anodic tantalum oxide thin films

โœ Scribed by V. I. Kukuev; E. A. Tutov; V. V. Chernyshev


Book ID
111501446
Publisher
Allerton Press Inc
Year
2009
Tongue
English
Weight
153 KB
Volume
73
Category
Article
ISSN
1062-8738

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๐Ÿ“œ SIMILAR VOLUMES


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โœ D.A Vermilyea ๐Ÿ“‚ Article ๐Ÿ“… 1954 ๐Ÿ› Elsevier Science โš– 560 KB

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Almbxct -The mobility of phosphorus incorporated as a mass marker into tantalum anodic oxide films was investigetcd by mtans of ion microprobe mass analysis. If the transport number of tantalum ions for the film formation is ~ssumcd to be CotMant regardless of the oxidation current density chosen, t