Flux creep in c-axis oriented epitaxial YBa2Cu3O7 thin film

✍ Scribed by Bai-ru Zhao; Shun-ichi Kuroumaru; Yuuji Horie; Eiji Yanada; Takafumi Aomine; Xiang-gang Qiu; Yin-zi Zhang; Yu-ying Zhao; Po Xu; Lin Li; Hiroshi Ohkubo; Shoichi Mase

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 832 KB
• Volume: 179
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/0921-4534(91)90022-q

✦ Synopsis

A systematic study of the flux creep behavior has been carried out for c-axis oriented epitaxial YBa2Cu307 thin films based on the Anderson and Kim flux creep model. In a wide magnetic field (H) range (0 to 12 T) and temperature (T) range ( 10 to 82 K), the behavior of the critical current density Jc, the flux bundle (size Vd and jump distance l) and resistive transition broadening ATe have been investigated. It is found that J¢(H, T) fairly well obeys the frame of flux creep model in the above temperature range; in a certain low-field region ( < 1 T), a relation of VdOCH -~ is found; in the high (H, T) region, Vdl shows an anomalous behavior which is discussed in terms of the decomposition of the flux bundle. It is also found that the relation of ATcozH 2/3 exists in all field orientations against the c-axis, but the slope of ATe versus H 2/3 depends strongly on orientation.