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Critical current density and flux creep in epitaxial YBa2Cu3O7−x thin films

✍ Scribed by G.C. Xiong; F.R. Wang; S.Z. Wang; Q.D. Jiang; J.Y. Li; Z.J. Yin; C.Y. Li; D.L. Yin

Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
231 KB
Volume
30
Category
Article
ISSN
0011-2275

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✦ Synopsis

The superconducting transition and critical current density were studied for epitaxial YBa2Cu307_x thin films as a function of temperature, magnetic field and electric voltage gradient. A linear section of the curve of the logarithm of apparent voltage versus transport current density, In(E)-J, was discovered in a region of low electric voltage gradient. According to the Anderson-Kim flux creep model a linear dependence is expected, as

From the linear fits in the set of In(E)-J curves, the value of D was obtained at different temperatures in variable magnetic fields. JD is a direct measurement of the dissipation energy caused by flux creep. The activation energy, Uo, was estimated from these measurements. The behaviour of the parameter D is discussed in terms of the flux creep model.

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