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Correlations between the critical current density and microwave surface impedance of epitaxial YBa2Cu3O7-δ films

✍ Scribed by A. Gladun; N. Cherpak; A. Gippius; S. Hensen; M. Lenkens; G. Müller; S. Orbach; H. Piel

Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
417 KB
Volume
32
Category
Article
ISSN
0011-2275

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✦ Synopsis

The microwave surface impedance and critical current density of epitaxially grown YBa2Cu307_~ films prepared by different techniques on MgO, SrTiO3, LaAIO 3 and NdGaO3 have been measured and the correlations between them are discussed. At 77 K, in most cases, the highest Jc values have been achieved for films with the lowest surface resistance R s, At 4 K the surface impedance still decreases with improved sample perfection, while the critical current seems to be independent of R s. The observed critical currents are three to five times lower than the depairing currents.

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