Flux creep in c-axis oriented epitaxial
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Bai-ru Zhao; Shun-ichi Kuroumaru; Yuuji Horie; Eiji Yanada; Takafumi Aomine; Xia
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Article
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1991
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Elsevier Science
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English
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A systematic study of the flux creep behavior has been carried out for c-axis oriented epitaxial YBa2Cu307 thin films based on the Anderson and Kim flux creep model. In a wide magnetic field (H) range (0 to 12 T) and temperature (T) range ( 10 to 82 K), the behavior of the critical current density J