A systematic study of the flux creep behavior has been carried out for c-axis oriented epitaxial YBa2Cu307 thin films based on the Anderson and Kim flux creep model. In a wide magnetic field (H) range (0 to 12 T) and temperature (T) range ( 10 to 82 K), the behavior of the critical current density J
โฆ LIBER โฆ
Epitaxial YBa2Cu3O7-x thin films with tilted c-axis orientation
โ Scribed by Yu.Ya. Divin; U. Poppe; J.-W. Seo; B. Kabius; K. Urban
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 181 KB
- Volume
- 235-240
- Category
- Article
- ISSN
- 0921-4534
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