Flux creep in YBa2Cu3O7 films
β Scribed by N. Kobayashi; Y. Minagawa; K. Watanabe; S. Awaji; H. Yamane; H. Kurosawa; T. Hirai
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 201 KB
- Volume
- 185-189
- Category
- Article
- ISSN
- 0921-4534
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π SIMILAR VOLUMES
A systematic study of the flux creep behavior has been carried out for c-axis oriented epitaxial YBa2Cu307 thin films based on the Anderson and Kim flux creep model. In a wide magnetic field (H) range (0 to 12 T) and temperature (T) range ( 10 to 82 K), the behavior of the critical current density J
The superconducting transition and critical current density were studied for epitaxial YBa2Cu307\_x thin films as a function of temperature, magnetic field and electric voltage gradient. A linear section of the curve of the logarithm of apparent voltage versus transport current density, In(E)-J, was