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Field-Plate Structure Dependence of Current Collapse Phenomena in High-Voltage GaN-HEMTs

✍ Scribed by Saito, W.; Kakiuchi, Y.; Nitta, T.; Saito, Y.; Noda, T.; Fujimoto, H.; Yoshioka, A.; Ohno, T.; Yamaguchi, M.

No coin nor oath required. For personal study only.

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