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Current Collapse and High-Electric-Field Reliability of Unpassivated GaN/AlGaN/GaN HEMTs

✍ Scribed by Gaudenzio Meneghesso; Fabiana Rampazzo; Peter Kordos; Giovanni Verzellesi; Enrico Zanoni

Book ID: 114618529
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 281 KB
Volume: 53
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2006.885681

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