✦ LIBER ✦
Low current dispersion and low bias-stress degradation of unpassivated GaN/AlGaN/GaN/SiC HEMTs
✍ Scribed by J. Bernát; R. Pierobon; M. Marso; J. Flynn; G. Brandes; G. Meneghesso; E. Zanoni; P. Kordoš
- Publisher
- John Wiley and Sons
- Year
- 2005
- Tongue
- English
- Weight
- 150 KB
- Volume
- 2
- Category
- Article
- ISSN
- 1862-6351
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