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Effect of Buffer Layer Structure on Drain Leakage Current and Current Collapse Phenomena in High-Voltage GaN-HEMTs

✍ Scribed by Saito, W.; Noda, T.; Kuraguchi, M.; Takada, Y.; Tsuda, K.; Saito, Y.; Omura, I.; Yamaguchi, M.

No coin nor oath required. For personal study only.

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