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Fault testing for reversible circuits

✍ Scribed by Patel, K.N.; Hayes, J.P.; Markov, I.L.

Book ID: 117907204
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 357 KB
Volume: 23
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2004.831576

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