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[IEEE 14th Asian Test Symposium (ATS'05) - Calcutta, India (2005.12.21-2005.12.21)] 14th Asian Test Symposium (ATS'05) - A Family of Logical Fault Models for Reversible Circuits

✍ Scribed by Polian, I.; Fiehn, T.; Becker, B.; Hayes, J.P.

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