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Derivation of test set for detecting multiple missing-gate faults in reversible circuits

✍ Scribed by Kole, Dipak K.; Rahaman, Hafizur; Das, Debesh K.; Bhattacharya, Bhargab B.


Book ID
122394449
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
838 KB
Volume
39
Category
Article
ISSN
0045-7906

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