✦ LIBER ✦
Detection of multiple stuck-on/stuck-open faults by single faults test sets in MOS transistor networks
✍ Scribed by François Darlay
- Book ID
- 107910414
- Publisher
- Elsevier Science
- Year
- 1991
- Weight
- 814 KB
- Volume
- 32
- Category
- Article
- ISSN
- 0165-6074
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