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[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Improved Fault Diagnosis for Reversible Circuits

✍ Scribed by Zhang, Hongyan; Wille, Robert; Drechsler, Rolf

No coin nor oath required. For personal study only.

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