Fault diagnosis in reversible circuits under missing-gate fault model
✍ Scribed by Hafizur Rahaman; Dipak K. Kole; Debesh K. Das; Bhargab B. Bhattacharya
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 669 KB
- Volume
- 37
- Category
- Article
- ISSN
- 0045-7906
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✦ Synopsis
This article presents a novel technique for fault detection as well as fault location in a reversible combinational circuit under the missing gate fault model. It is shown that in an (n  n) reversible circuit implemented with k-CNOT gates, addition of only one extra control line along with duplication each k-CNOT gate, yields an easily testable design, which admits a universal test set (UTS) of size (n + 1) that detects all single missing-gate faults (SMGFs), repeated-gate faults (RGFs), and partial missing-gate faults (PMGFs) in the circuit. Furthermore, storage of only one vector (seed) of the UTS is required; the rest can be generated by n successive cyclic bit-shifts from the seed. For fault location under the SMGF model, a technique for identifying the faulty gate is also presented that needs application of a single test vector, provided the circuit is augmented with some additional observable outputs.