𝔖 Bobbio Scriptorium
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Fault simulation and digital circuit testability

✍ Scribed by P. DesMarais; M. Krieger


Publisher
Elsevier Science
Year
1976
Tongue
English
Weight
521 KB
Volume
15
Category
Article
ISSN
0026-2714

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πŸ“œ SIMILAR VOLUMES


Circuits over monoids: a fault model, an
✍ H.A. Farhat; J.C. Birget πŸ“‚ Article πŸ“… 1992 πŸ› Elsevier Science 🌐 English βš– 297 KB

We introduce a new fault model for evaluation circuits and prefix circuits over a transformation monoid. For evaluation circuits we give a trade-off between the delay of the circuit and the number of test-inputs needed to detect faultiness.