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Multifault and delay-fault testability of multilevel circuits

✍ Scribed by Wuudiann Ke; P. R. Menon

Publisher: Springer US
Year: 1995
Tongue: English
Weight: 327 KB
Volume: 6
Category: Article
ISSN: 0923-8174
DOI: 10.1007/bf00996442

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