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Failure analysis of pad-height effects in the fine-pitch interconnection of the anisotropic conductive films

โœ Scribed by Chao-Ming Lin; Tzu-Chao Lin; Te-Hua Fang; Kuo-Sheng Chao


Book ID
104057985
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
666 KB
Volume
48
Category
Article
ISSN
0026-2714

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