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Use of the anisotropic magnetoresistance effect for direct measurement of the coercivity and exchange bias fields of magnetization reversal in conducting magnetic films of nanometer thickness

โœ Scribed by A. V. Medved; R. G. Kryshtal; A. I. Krikunov; S. I. Kasatkin


Book ID
110144399
Publisher
SP MAIK Nauka/Interperiodica
Year
2005
Tongue
English
Weight
37 KB
Volume
31
Category
Article
ISSN
1063-7850

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