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Extracting a bias-dependent large signal MESFET model from pulsed I/V measurements

โœ Scribed by Fernandez, T.; Newport, Y.; Zamanillo, J.M.; Tazon, A.; Mediavilla, A.

Book ID
114552615
Publisher
IEEE
Year
1996
Tongue
English
Weight
756 KB
Volume
44
Category
Article
ISSN
0018-9480

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'IEEE Catalog Number: 04CH37512'--T.p. verso.' ... ISCAS 2004 ...'--p. iii.Includes bibliographical references and author indexes.Also available via the World Wide Web.