✦ LIBER ✦
Accurate modeling of electron device I/V characteristics through a simplified large-signal measurement setup
✍ Scribed by A. Raffo; A. Santarelli; P. A. Traverso; M. Pagani; G. Vannini; F. Filicori
- Publisher
- John Wiley and Sons
- Year
- 2005
- Tongue
- English
- Weight
- 480 KB
- Volume
- 15
- Category
- Article
- ISSN
- 1096-4290
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