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A spline large-signal FET model based on bias-dependent pulsed I-V measurement

✍ Scribed by Kyoungmin Koh; Hyun-Min Park; Songcheol Hong

Book ID: 114659679
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 510 KB
Volume: 50
Category: Article
ISSN: 0018-9480
DOI: 10.1109/tmtt.2002.804509

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