A CAD-oriented nonlinear model of SiC MESFET based on pulsed I(V), pulsed S-parameter measurements

✍ Scribed by Siriex, D.; Noblanc, O.; Barataud, D.; Chartier, E.; Brylinski, C.; Quere, R.

• Book ID: 114537591
• Publisher: IEEE
• Year: 1999
• Tongue: English
• Weight: 163 KB
• Volume: 46
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.748881