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[IEEE 2010 76th ARFTG Microwave Measurement Conference - Clearwater Beach, FL, USA (2010.11.30-2010.12.3)] 2010 76th ARFTG Microwave Measurement Conference - A de-embedding procedure oriented to the determination of FET intrinsic I-V characteristics from high-frequency large-signal measurements

โœ Scribed by Avolio, G.; Schreurs, D.; Raffo, A.; Crupi, G.; Vannini, G.; Nauwelaers, B.


Book ID
126793718
Publisher
IEEE
Year
2010
Weight
652 KB
Category
Article
ISBN
1424474477

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