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[IEEE 2010 76th ARFTG Microwave Measurement Conference - Clearwater Beach, FL, USA (2010.11.30-2010.12.3)] 2010 76th ARFTG Microwave Measurement Conference - Traceability to national standards for S-parameter measurements in waveguide at frequencies from 140 GHz to 220 GHz

✍ Scribed by Ridler, Nick; Clarke, Roland; Salter, Martin; Wilson, Alan

Book ID: 126748800
Publisher: IEEE
Year: 2010
Weight: 577 KB
Category: Article
ISBN: 1424474477
DOI: 10.1109/ARFTG76.2010.5700046

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