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[IEEE 2010 76th ARFTG Microwave Measurement Conference - Clearwater Beach, FL, USA (2010.11.30-2010.12.3)] 2010 76th ARFTG Microwave Measurement Conference - Through-wafer via modeling based on direct RF characterization

✍ Scribed by Brunsman, M. D.

Book ID: 118209744
Publisher: IEEE
Year: 2010
Weight: 765 KB
Volume: 0
Category: Article
ISBN: 1424474477
DOI: 10.1109/arftg76.2010.5700045

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