𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2010 76th ARFTG Microwave Measurement Conference - Clearwater Beach, FL, USA (2010.11.30-2010.12.3)] 2010 76th ARFTG Microwave Measurement Conference - Understanding transistor channel temperature in nonlinear microwave measurements and device operation

✍ Scribed by Baylis, Charles; Jean, Buford Randall; Martin, Josh; Wang, Loria; Moldovan, Matthew; Miller, Hunter

Book ID: 126675847
Publisher: IEEE
Year: 2010
Weight: 109 KB
Category: Article
ISBN: 1424474477
DOI: 10.1109/ARFTG76.2010.5700061

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2010 76th ARFTG Microwave Measurem

[IEEE 2010 76th ARFTG Microwave Measurement Conference - Clearwater Beach, FL, USA (2010.11.30-2010.12.3)] 2010 76th ARFTG Microwave Measurement Conference - Modal calibration of GSSG probes

✍ Hayden, Leonard 📂 Article 📅 2010 🏛 IEEE ⚖ 289 KB

[IEEE 2010 76th ARFTG Microwave Measurem

[IEEE 2010 76th ARFTG Microwave Measurement Conference - Clearwater Beach, FL, USA (2010.11.30-2010.12.3)] 2010 76th ARFTG Microwave Measurement Conference - Through-wafer via modeling based on direct RF characterization

✍ Brunsman, M. D. 📂 Article 📅 2010 🏛 IEEE ⚖ 765 KB

[IEEE 2010 76th ARFTG Microwave Measurem

[IEEE 2010 76th ARFTG Microwave Measurement Conference - Clearwater Beach, FL, USA (2010.11.30-2010.12.3)] 2010 76th ARFTG Microwave Measurement Conference - Rectangular-waveguide vector-network-analyzer calibrations with imperfect test ports

✍ Williams, Dylan F. 📂 Article 📅 2010 🏛 IEEE ⚖ 187 KB

[IEEE 2010 76th ARFTG Microwave Measurem

[IEEE 2010 76th ARFTG Microwave Measurement Conference. Millimeter-wave Measurements and Modeling - Clearwater Beach, FL (2010.11.30-2010.12.3)] 2010 76th ARFTG Microwave Measurement Conference - Shielded coaxial open as high frequency impedance standard

✍ Hui Huang, ; Xinmeng Liu, ; Yeou-Song Lee, 📂 Article 📅 2010 🏛 IEEE ⚖ 92 KB

[IEEE 2010 76th ARFTG Microwave Measurem

[IEEE 2010 76th ARFTG Microwave Measurement Conference - Clearwater Beach, FL, USA (2010.11.30-2010.12.3)] 2010 76th ARFTG Microwave Measurement Conference - Traceability to national standards for S-parameter measurements in waveguide at frequencies from 140 GHz to 220 GHz

✍ Ridler, Nick; Clarke, Roland; Salter, Martin; Wilson, Alan 📂 Article 📅 2010 🏛 IEEE ⚖ 577 KB

[IEEE 2010 76th ARFTG Microwave Measurem

[IEEE 2010 76th ARFTG Microwave Measurement Conference - Clearwater Beach, FL, USA (2010.11.30-2010.12.3)] 2010 76th ARFTG Microwave Measurement Conference - A de-embedding procedure oriented to the determination of FET intrinsic I-V characteristics from high-frequency large-signal measurements

✍ Avolio, G.; Schreurs, D.; Raffo, A.; Crupi, G.; Vannini, G.; Nauwelaers, B. 📂 Article 📅 2010 🏛 IEEE ⚖ 652 KB