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Exploring the high sensitivity of SU-8 resist for high resolution electron beam patterning

✍ Scribed by A. Pépin; V. Studer; D. Decanini; Y. Chen


Book ID
108207339
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
353 KB
Volume
73-74
Category
Article
ISSN
0167-9317

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