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Experimental and theoretical investigations on short-channel effects in 4H-SiC MOSFETs

โœ Scribed by Noborio, M.; Kanzaki, Y.; Jun Suda; Kimoto, T.


Book ID
114617936
Publisher
IEEE
Year
2005
Tongue
English
Weight
630 KB
Volume
52
Category
Article
ISSN
0018-9383

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