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Evaluation of thin films fabricated by low energy direct ion beam deposition for soft X-rays

✍ Scribed by Ito Kazuhiko; Yonemitsu Toshihiro; Etoh Kazuyuki; Sekiguchi Hisao; Yamada Ichiro; Kataoka Izumi; Hervé-André Durand

No coin nor oath required. For personal study only.

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