𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Evaluation of Residual Stress in Nano-TiO2 Film on ITO Glass by Synchrotron X-Ray Diffraction

✍ Scribed by Ju, Dong Ying; Ueda, T.; Hatakeyama, Tetsuo; Arizono, T.; Kusaka, Kazuya; Hanabusa, Takao

Book ID
120410552
Publisher
Trans Tech Publications, Ltd.
Year
2005
Tongue
English
Weight
338 KB
Volume
490-491
Category
Article
ISSN
1662-9752

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Studies on mechanical properties of poly
Studies on mechanical properties of polymer composites by X-ray diffraction. I. Residual stress in epoxy resin by X-ray diffraction
✍ Katsuhiko Nakamae; Takashi Nishino; Xu Airu; Takeshi Matsumoto; Tomoharu Miyamot πŸ“‚ Article πŸ“… 1990 πŸ› John Wiley and Sons 🌐 English βš– 404 KB πŸ‘ 2 views

Residual stress in epoxy resin cured on A1 plate was investigated by X-ray diffraction. Microdeformation of A1 crystal can be detected as a shift of X-ray diffraction peak induced by the stress resided. Results show that A1 plate is subjected to a uniaxial compressive stress of 29 MPa parallel to th