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A study of (111) oriented epitaxial thin films of In2O3 on cubic Y-doped ZrO2 by synchrotron-based x-ray diffraction

✍ Scribed by Regoutz, Anna; Zhang, Kelvin H.L.; Egdell, Russell G.; Wermeille, Didier; Cowley, Roger A.

Book ID: 120435691
Publisher: Cambridge University Press
Year: 2012
Tongue: English
Weight: 635 KB
Volume: 27
Category: Article
ISSN: 0884-2914
DOI: 10.1557/jmr.2012.162

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