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Evaluation of mechanical distortion of SiC x-ray mask substrate

✍ Scribed by Yoh-ichi Yamaguchi; Tsutomu Syoki; Minoru Sugawara


Book ID
103598551
Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
305 KB
Volume
17
Category
Article
ISSN
0167-9317

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