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Evaluation of electrical properties of vanadium suicide-silicon Schottky diodes formed by ion implantation

✍ Scribed by V.P. Salvi; A.M. Narsale; Subhaga Vidwans; A.A. Rangwala; B.M. Arora; Animesh K. Jain; Kuldeep

No coin nor oath required. For personal study only.

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