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Etch characteristics of HfO2 thin films by using CF4/Ar inductively coupled plasma

โœ Scribed by Kang, Pil-Seung; Woo, Jong-Chang; Joo, Young-Hee; Kim, Chang-Il


Book ID
120771622
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
898 KB
Volume
93
Category
Article
ISSN
0042-207X

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